Troubleshooting on Microprocessor Based Systems.

By: Williams, G. BContributor(s): Hopkins, D. WMaterial type: TextTextSeries: eBooks on DemandPublisher: Kent : Elsevier Science & Technology, 2013Copyright date: ©1984Description: 1 online resource (233 pages)Content type: text Media type: computer Carrier type: online resourceISBN: 9781483293400Subject(s): Debugging in computer science | Microcomputers -- TestingGenre/Form: Electronic books.Additional physical formats: Print version:: Troubleshooting on Microprocessor Based SystemsDDC classification: 621.381 LOC classification: TK7887 .W54 2014Online resources: Click here to view this ebook.
Contents:
Front Cover -- Troubleshooting on Microprocessor Based Systems -- Copyright Page -- Table of Contents -- Chapter 1. INTRODUCTION TO MICROPROCESSOR BASED SYSTEMS -- 1.1 The Digital Computer -- 1.2 Bus Structured Systems -- 1.3 Memory Mapped Systems -- 1.4 Tri-state Devices -- 1.5 Address Decoding -- 1.6 A Microcontroller -- 1.7 Programming Levels -- Chapter 2. SYSTEM TESTING PROBLEMS -- 2.1 Hardware or Software? -- 2.2 Time Sequential, Bit Parallel Data -- 2.3 Bus Multiplexing -- 2.4 The Device Testing Problem -- 2.5 The System Kernel -- 2.6 CPU Testing -- 2.7 ROM Testing -- 2.8 RAM Testing -- 2.9 Input/Output Testing -- 2.10 Some Common System Problems -- Chapter 3. SYSTEM TESTING PHILOSOPHY -- 3.1 Self-test Programs -- 3.2 Is There Really a Fault? -- 3.3 The Life-cycle of an Integrated Circuit -- 3.4 Stress Testing -- 3.5 Isolation Techniques -- 3.6 The Troubleshooting Tree -- Chapter 4. THE USE OF CONVENTIONAL TEST EQUIPMENT -- 4.1 Multimeters -- 4.2 Frequency Counters -- 4.3 The Oscilloscope -- 4.4 The Limitations of Conventional Test Equipment -- Chapter 5. HAND-HELD TOOLS -- 5.1 Logic Probes -- 5.2 Logic Pulsers -- 5.3 Stimulus-response Testing Using a Pulser and Probe -- 5.4 The Current Tracer -- 5.5 Logic Comparators -- 5.6 The Limitations of Hand-held Tools -- Chapter 6. LOGIC ANALYSERS -- 6.1 Logic State Analysers -- 6.2 Logic Timing Analysers -- 6.3 Display Modes -- 6.4 Logic Analyser Features -- Chapter 7. SIGNATURE ANALYSERS -- 7.1 The Nature of Digital Waveforms -- 7.2 Transition Counting -- 7.3 The Probability of Success Using the Transition Counting Technique -- 7.4 Cyclic Redundancy Check Codes -- 7.5 Signature Analysis -- 7.6 The Probability of Success Using Signature Analysis -- 7.7 A Simple Signature Analyser -- 7.8 Free-run Testing Using a Signature Analyser -- 7.9 ROM Testing During Free-run.
7.10 Signature Analysis Test Loops -- 7.11 Retrofitting Signature Analysis -- 7.12 Limitations of Signature Analysis -- 7.13 Signature Analysis as a General Test Technique -- Chapter 8. EMULATION -- 8.1 Development Systems -- 8.2 System Testing Using a Development System -- 8.3 Stand-alone Emulators -- Chapter 9. SELF-TEST AND DIAGNOSTIC SOFTWARE -- 9.1 Self-test Routines -- 9.2 Diagnostic Tests -- Chapter 10. TESTING PERIPHERAL RELATED FUNCTIONS -- 10.1 An Example of Sub-system Functional Testing -- 10.2 Testing Serial Data Communication Lines -- 10.3 Monitoring the IEEE-488 Instrumentation Bus -- REFERENCES -- INDEX.
Summary: The structure of a computing system presents unique problems when it fails to operate correctly and requires testing. This concise, yet comprehensive book describes the major test methods in current use, and their development from basic principles. Examines the sequence of tests which, built on each other, provide a suitable vehicle for testing digital systems, and the various types of testing equipment that should be applied for specific tests. An excellent introduction for those entering this increasingly complex world, the text will provide the reader with a firm basis on which to judge future development.
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Front Cover -- Troubleshooting on Microprocessor Based Systems -- Copyright Page -- Table of Contents -- Chapter 1. INTRODUCTION TO MICROPROCESSOR BASED SYSTEMS -- 1.1 The Digital Computer -- 1.2 Bus Structured Systems -- 1.3 Memory Mapped Systems -- 1.4 Tri-state Devices -- 1.5 Address Decoding -- 1.6 A Microcontroller -- 1.7 Programming Levels -- Chapter 2. SYSTEM TESTING PROBLEMS -- 2.1 Hardware or Software? -- 2.2 Time Sequential, Bit Parallel Data -- 2.3 Bus Multiplexing -- 2.4 The Device Testing Problem -- 2.5 The System Kernel -- 2.6 CPU Testing -- 2.7 ROM Testing -- 2.8 RAM Testing -- 2.9 Input/Output Testing -- 2.10 Some Common System Problems -- Chapter 3. SYSTEM TESTING PHILOSOPHY -- 3.1 Self-test Programs -- 3.2 Is There Really a Fault? -- 3.3 The Life-cycle of an Integrated Circuit -- 3.4 Stress Testing -- 3.5 Isolation Techniques -- 3.6 The Troubleshooting Tree -- Chapter 4. THE USE OF CONVENTIONAL TEST EQUIPMENT -- 4.1 Multimeters -- 4.2 Frequency Counters -- 4.3 The Oscilloscope -- 4.4 The Limitations of Conventional Test Equipment -- Chapter 5. HAND-HELD TOOLS -- 5.1 Logic Probes -- 5.2 Logic Pulsers -- 5.3 Stimulus-response Testing Using a Pulser and Probe -- 5.4 The Current Tracer -- 5.5 Logic Comparators -- 5.6 The Limitations of Hand-held Tools -- Chapter 6. LOGIC ANALYSERS -- 6.1 Logic State Analysers -- 6.2 Logic Timing Analysers -- 6.3 Display Modes -- 6.4 Logic Analyser Features -- Chapter 7. SIGNATURE ANALYSERS -- 7.1 The Nature of Digital Waveforms -- 7.2 Transition Counting -- 7.3 The Probability of Success Using the Transition Counting Technique -- 7.4 Cyclic Redundancy Check Codes -- 7.5 Signature Analysis -- 7.6 The Probability of Success Using Signature Analysis -- 7.7 A Simple Signature Analyser -- 7.8 Free-run Testing Using a Signature Analyser -- 7.9 ROM Testing During Free-run.

7.10 Signature Analysis Test Loops -- 7.11 Retrofitting Signature Analysis -- 7.12 Limitations of Signature Analysis -- 7.13 Signature Analysis as a General Test Technique -- Chapter 8. EMULATION -- 8.1 Development Systems -- 8.2 System Testing Using a Development System -- 8.3 Stand-alone Emulators -- Chapter 9. SELF-TEST AND DIAGNOSTIC SOFTWARE -- 9.1 Self-test Routines -- 9.2 Diagnostic Tests -- Chapter 10. TESTING PERIPHERAL RELATED FUNCTIONS -- 10.1 An Example of Sub-system Functional Testing -- 10.2 Testing Serial Data Communication Lines -- 10.3 Monitoring the IEEE-488 Instrumentation Bus -- REFERENCES -- INDEX.

The structure of a computing system presents unique problems when it fails to operate correctly and requires testing. This concise, yet comprehensive book describes the major test methods in current use, and their development from basic principles. Examines the sequence of tests which, built on each other, provide a suitable vehicle for testing digital systems, and the various types of testing equipment that should be applied for specific tests. An excellent introduction for those entering this increasingly complex world, the text will provide the reader with a firm basis on which to judge future development.

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